Hardback (30 Jun 2003)
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Out of stock
These conference proceedings cover such topics as: benchmarking; workload characterization; simulation; analytical modes; statistical approaches; metrics; power and thermal modelling; validation; characterization of emerging applications/systems/microarchitectures; and case studies.
| ISBN: | 9780780377561 |
| Publisher: | IEEE |
| Imprint: | IEEE |
| Pub date: | 30 Jun 2003 |
| DEWEY: | 004.24 |
| DEWEY edition: | 22 |
| Language: | English |
| Number of pages: | 223 |
| Weight: | -1g |
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