Book (30 Sep 2000)
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The proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2000. Topics include: device simulation; quantum effects and novel devices; process simulation; lithography simulation; user interfaces and visualization; calibration; and more.
| ISBN: | 9780780362796 |
| Publisher: | IEEE |
| Imprint: | IEEE |
| Pub date: | 30 Sep 2000 |
| DEWEY: | 621.38152015118 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 282 |
| Weight: | -1g |
| Height: | 273mm |
| Width: | 209mm |
| Spine width: | 19mm |
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