Book (31 May 2000)
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A study of defect based testing, containing papers from an IEEE workshop held in 2000. Areas addressed include: deep sub-micron IDDQ testing; defect oriented testing; current measurement and yield; and current and voltage test techniques.
| ISBN: | 9780769506371 |
| Publisher: | IEEE Computer Society |
| Imprint: | IEEE Computer Society |
| Pub date: | 31 May 2000 |
| DEWEY: | 621.3815 |
| DEWEY edition: | 22 |
| Language: | English |
| Number of pages: | 82 |
| Weight: | -1g |
| Height: | 266mm |
| Width: | 209mm |
| Spine width: | 6mm |
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