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2000 5th International Workshop on Statistical Metrology

2000 5th International Workshop on Statistical Metrology IWSM, June 11, 2000, Hawaii

Hardback (31 Aug 2000)

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Book information

ISBN: 9780780358966
Publisher: IEEE Electron Devices Society
Imprint: IEEE Electron Devices Society
Pub date:
DEWEY: 621.381520287
DEWEY edition: 22
Language: English
Number of pages: 83
Weight: -1g
Height: 266mm
Width: 209mm
Spine width: 6mm