Paperback (31 May 2001)
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Out of stock
Topics include: BIST techniques; diagnosis methods; test data compression; synthesis and design for testability; diagnosis and verification ATPG; defect analysis and IDDx diagnosis; SoC testing; self-test techniques; memory diagnosis; novel ATPG techniques; fault modelling and BIST evaluation.
| ISBN: | 9780769511221 |
| Publisher: | I.E.E.E.Press |
| Imprint: | I.E.E.E.Press |
| Pub date: | 31 May 2001 |
| Language: | English |
| Number of pages: | 456 |
| Weight: | -1g |
| Height: | 266mm |
| Width: | 209mm |
| Spine width: | 25mm |
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