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19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings, 10-13 October 2004, Cannes, Franc

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings, 10-13 October 2004, Cannes, Franc

Paperback (07 Nov 2004)

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Book information

ISBN: 9780769522418
Publisher: IEEE Computer Soc/IEEE Service Ctr
Pub date:
Number of pages: 506 p.