Hardback (28 Feb 2000)
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This text constitutes the final report produced from the IEEE International Integrated Reliability Workshop, which took part in 1999.
| ISBN: | 9780780356498 |
| Publisher: | IEEE Electron Devices Society |
| Imprint: | IEEE Electron Devices Society |
| Pub date: | 28 Feb 2000 |
| DEWEY: | 621.3815 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 188 |
| Weight: | -1g |
| Height: | 273mm |
| Width: | 215mm |
| Spine width: | 12mm |
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