Book (30 Nov 1998)
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This is a collection of essays from the International Workshop on IDDQ Testing 1998. Topics include: effective IDDQ testing; approaches for current-based testing; separating good chips from the bad; and core-based systems and testability.
| ISBN: | 9780818691911 |
| Publisher: | IEEE Computer Society Press |
| Imprint: | IEEE Computer Society Press |
| Pub date: | 30 Nov 1998 |
| DEWEY: | 621.3950287 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 82 |
| Weight: | -1g |
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