Hardback (31 Oct 1998)
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The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. Topics include: contributors to failure; waver level reliability; building in reliability; and reliability test structures.
| ISBN: | 9780780348813 |
| Publisher: | IEEE Electron Devices Society |
| Imprint: | IEEE Electron Devices Society |
| Pub date: | 31 Oct 1998 |
| DEWEY: | 621.3815 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 140 |
| Weight: | -1g |
| Height: | 266mm |
| Width: | 209mm |
| Spine width: | 6mm |
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