Hardback (31 Mar 1998)
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The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. Topics reproduced in this volume include: BIR - breaking down barriers; and shear test for adhesion measurement of small structures.
| ISBN: | 9780780342057 |
| Publisher: | IEEE Electron Devices Society |
| Imprint: | IEEE Electron Devices Society |
| Pub date: | 31 Mar 1998 |
| DEWEY: | 621.3815 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 161 |
| Weight: | -1g |
| Height: | 273mm |
| Width: | 215mm |
| Spine width: | 6mm |
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