Automotive Process Audits
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Published 08 Oct 2024
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1996 International Integrated Reliability Workshop Final Report Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 1996
Hardback (31 Dec 1997)
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Book information
| ISBN: | 9780780335981 |
| Publisher: | IEEE Electron Devices Society |
| Imprint: | IEEE Electron Devices Society |
| Pub date: | 31 Dec 1997 |
| DEWEY: | 621.3815 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 175 |
| Weight: | -1g |
| Height: | 285mm |
| Width: | 222mm |
| Spine width: | 12mm |
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