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1995 International Integrated Reliability Workshop Final Report

1995 International Integrated Reliability Workshop Final Report Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995

Book (01 Jan 1996)

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Book information

ISBN: 9780780327054
Publisher: IEEE Electron Devices Society
Imprint: IEEE Electron Devices Society
Pub date:
DEWEY: 621.3815
DEWEY edition: 20
Language: English
Number of pages: 173