18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Proceedings : 3-5 November, 2003, Boston, Massachusetts

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, C Bolchini, IEEE Computer Society, IEEE Computer Society

Book (01 Jan 2003)

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Publisher's Synopsis

Papers from a November 2003 symposium address topics in the research, design, and implementation of defect- and fault-tolerant VLSI systems. The papers reflect the enlargement of the symposium's technical program to include new avenues of research, from built-in self-test to automatic test equipment, FPGAs, and yield models. Papers are in sections

Book information

ISBN:	9780769520421
Publisher:	IEEE Computer Society Press
Imprint:	IEEE Computer Society Press
Pub date:	01 Jan 2003
Language:	English
Number of pages:	607
Weight:	-1g