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14th IEEE Vlsi Test Symposium

14th IEEE Vlsi Test Symposium April 28-May 1, 1996, Princeton, New Jersey : Proceedings

Paperback (31 Dec 1996)

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    Publisher's Synopsis

    Reports on recent concepts, methodologies, and trends in testing electronic circuits and systems to meet the challenges of a wider range of capabilities being integrated into compact products, and the higher quality being demanded. Some 90 papers explore such aspects as designing for testability, on-line testing, volume manufacturing, sequential ci

    Book information

    ISBN: 9780818673047
    Publisher: IEEE Computer Society Press,U.S.
    Imprint: IEEE Computer Society Press,U.S.
    Pub date:
    DEWEY: 621.3950287
    Language: English
    Number of pages: 510
    Weight: -1g
    Height: 279mm
    Width: 222mm
    Spine width: 31mm

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